Generate X̄-R and I-MR control charts with capability analysis
For subgroups of 2-10 measurements. Monitors process mean and range. Each line = one subgroup.
For individual measurements (subgroup size = 1). Uses moving range. One value per line.
Statistical Process Control (SPC) charts monitor process stability over time. Control limits are calculated from the data itself (±3 sigma), distinct from specification limits.
A process is "in control" when all points fall within control limits and show no non-random patterns. Capability indices (Cp, Cpk) compare process spread to specification tolerance.